[H-2-5] Electronic Structure of Carbon Nanowalls using Resonant Soft-X-Ray Emission Spectroscopy
W. Takeuchi1, M. Hiramatsu2, Y. Tokuda3, H. Kano4, T. Kinoshita5, Y. Kato5, T. Muro5, S. Kimura5, M. Hori1
(1.Nagoya Univ.(Japan), 2.Aichi Inst. Of Tech.(Japan), 3.Meijo Univ.(Japan), 4.NU Eco-Engi. Co. ,Ltd.(Japan), 5.JASRI/Spring-8(Japan))
https://doi.org/10.7567/SSDM.2009.H-2-5