[K-5-4] Cross-sectional Low-temperature Scanning Tunneling Spectroscopy of a p-n Junction and an Inversion Layer in InAs

K. Suzuki¹, K. Kanisawa¹, K. Onomitsu¹, K. Muraki¹ (1.NTT Basic Res.Labs.)

https://doi.org/10.7567/SSDM.2009.K-5-4