[K-5-4] Cross-sectional Low-temperature Scanning Tunneling Spectroscopy of a p-n Junction and an Inversion Layer in InAs

K. Suzuki¹、K. Kanisawa¹、K. Onomitsu¹、K. Muraki¹ (1.NTT Basic Res.Labs.)

https://doi.org/10.7567/SSDM.2009.K-5-4