[P-1-4] Study of La-doped GeO₂ Films from Defect Annihilation Viewpoint

T. Tabata^1,2、K. Kita^1,2、A. Toriumi^1,2 (1.Univ. of Tokyo(Japan)、2.CREST-JST(Japan))

https://doi.org/10.7567/SSDM.2009.P-1-4