[P-12-6] Effects of Hole Doping in the Ferromagnetic Semiconductor Mn-doped ZnO Thin Film Studied by X-ray Magnetic Circular Dichroism
T. Kataoka1、Y. Sakamoto1、M. Kobayashi1、V. R. Singh1、Y. Yamazaki1、A. Fujimori1,2、F. H. Chang3、H. J. Lin3、D. J. Huang3、C. T. Chen3、Y. Takeda2、T. Ohkochi2、T. Okane2、Y. Saitoh2、H. Yamagami2,4、M. Kapilashrami5、L. Belova5、K. V. Rao5
(1.Univ. of Tokyo(Japan)、2.JAEA/SPring-8(Japan)、3.NSRRC(Taiwan)、4.Kyoto sangyo Univ.(Japan)、5.Royal Inst. of Tech.(Sweden))
https://doi.org/10.7567/SSDM.2009.P-12-6