[P-14-4] Improvement in Quantitative Analysis of Defects and Microstructures in Si Multicrystals using X-ray Diffraction

K. Kutsukake¹、N. Usami¹、K. Fujiwara¹、K. Nakajima¹ (1.Tohoku Univ.)

https://doi.org/10.7567/SSDM.2009.P-14-4