[P-4-9] Improved Switching Uniformity of a Carbon-based ReRAM device by Controlling Size of Conducting Filament

J. Park¹、H. Choi¹、M. Jo¹、J. Lee¹、T. W. Kim¹、J. Yoon¹、D. J. Seong¹、W. Lee¹、M. Chang¹、J. Shin¹、T. Lee¹、H. Hwang¹ (1.Gwangju Inst. Of Sci. and Tech.)

https://doi.org/10.7567/SSDM.2009.P-4-9