[A-7-3] Bias-temperature-instability and thermal anneal effects of organic thin-film transistors

P. H. Chen¹、P. Y. Lo^1,2、T. S. Hu²、P. W. Li¹ (1.National Central Univ.、2.Indus. Tech. Res. Inst. , Taiwan)

https://doi.org/10.7567/SSDM.2010.A-7-3