[A-7-3] Bias-temperature-instability and thermal anneal effects of organic thin-film transistors

P. H. Chen¹, P. Y. Lo^1,2, T. S. Hu², P. W. Li¹ (1.National Central Univ., 2.Indus. Tech. Res. Inst. , Taiwan)

https://doi.org/10.7567/SSDM.2010.A-7-3