[B-2-1] Effects of GeO₂-Metal Interaction on V_FB of GeO² MIS Gate Stacks

F. I. Alzakia¹, K. Kita^1,2, T. Nishimura^1,2, K. Nagashio^1,2, A. Toriumi^1,2 (1.Univ. of Tokyo, 2.JST-CREST , Japan)

https://doi.org/10.7567/SSDM.2010.B-2-1