[B-9-1] Measurements of Electrostatic Potential Across p-n Junctions on Oxidized Si Surfaces by Scanning Multi-Mode Tunneling Spectroscopy
L. Bolotov1, T. Tada1, M. Iitake1, M. Nishizawa1, T. Kanayama1
(1.AIST , Japan)
https://doi.org/10.7567/SSDM.2010.B-9-1
