[B-9-1] Measurements of Electrostatic Potential Across p-n Junctions on Oxidized Si Surfaces by Scanning Multi-Mode Tunneling Spectroscopy

L. Bolotov¹、T. Tada¹、M. Iitake¹、M. Nishizawa¹、T. Kanayama¹ (1.AIST , Japan)

https://doi.org/10.7567/SSDM.2010.B-9-1