[C-1-2] New Insights into Flicker Noise Improvement Mechanism Using Random Telegraph Signal Technique

T. L. Li¹、S. Y. Huang¹、B. Hung¹、C. Y. Tzeng¹、S. Chou¹ (1.United Microelectronics Corp. , Taiwan)

https://doi.org/10.7567/SSDM.2010.C-1-2