[C-1-2] New Insights into Flicker Noise Improvement Mechanism Using Random Telegraph Signal Technique

T. L. Li¹, S. Y. Huang¹, B. Hung¹, C. Y. Tzeng¹, S. Chou¹ (1.United Microelectronics Corp. , Taiwan)

https://doi.org/10.7567/SSDM.2010.C-1-2