Using Power Transform to Study DC and AC CHC Effects on nMOSFETs in 65 nm Technology

S. Y. Chen; C. H. Tu; M. X. Wu; H. S. Huang; Z. W. Jhou; S. Chou; J. Ko

doi:https://doi.org/10.7567/SSDM.2010.C-8-1

2010 International Conference on Solid State Devices and Materials

Sep 21, 2010 - Sep 24, 2010
The University of Tokyo, Tokyo, Japan

[C-8-1] Using Power Transform to Study DC and AC CHC Effects on nMOSFETs in 65 nm Technology

S. Y. Chen¹, C. H. Tu¹, M. X. Wu¹, H. S. Huang¹, Z. W. Jhou², S. Chou², J. Ko² (1.National Taipei Univ. of Tech., 2.United Microelectronics Corp. , Taiwan)

https://doi.org/10.7567/SSDM.2010.C-8-1

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