[C-8-1] Using Power Transform to Study DC and AC CHC Effects on nMOSFETs in 65 nm Technology

S. Y. Chen¹、C. H. Tu¹、M. X. Wu¹、H. S. Huang¹、Z. W. Jhou²、S. Chou²、J. Ko² (1.National Taipei Univ. of Tech.、2.United Microelectronics Corp. , Taiwan)

https://doi.org/10.7567/SSDM.2010.C-8-1