[E-3-2] Collective Tunneling Model in Charge Trap Type NVM Cell

M. Muraguchi¹、Y. Sakurai²、Y. Takada²、Y. Shigeta⁴、M. Ikeda³、K. Makihara³、S. Miyazaki³、S. Nomura²、K. Shiraishi²、T. Endoh¹ (1.Tohoku Univ.、2.Univ. of Tsukuba、3.Hiroshima Univ.、4.Univ. of Hyogo , Japan)

https://doi.org/10.7567/SSDM.2010.E-3-2