[E-4-3] POST-BREAKDOWN RECOVERABLE METAL NANOCRYSTAL-BASED AL2O3/SIO2GATE STACK FOR NON-VOLATILE MEMORY
Y. N. Chen1,2, K. L. Pey1, K. E. J. Goh2, Z. Z. Lwin1, P. K. Singh3, S. Mahapatra3, Q. X. Wang4, J. Zhu4
(1.Nanyang Tech. Univ., 2.Inst. of Material Res. and Eng.,A*STAR , Singapore, 3.Indian Inst. of Tech. , India, 4.GlobalFoundries Singapore Pte. Ltd , Singapore)
https://doi.org/10.7567/SSDM.2010.E-4-3