[G-2-3] Wide-Frequency-Range Low-Noise Injection-locked Ring VCO for UWB Applications in 90 nm CMOS

S. Y. Lee¹, S. Amakawa¹, N. Ishihara¹, K. Masu¹ (1.Tokyo Tech , Japan)

https://doi.org/10.7567/SSDM.2010.G-2-3