[G-3-2] Analysis of Within-Die and Die-to-Die CMOS-Process Variation With Reconfigurable Ring-Oscillator Arrays

T. Ansari¹, W. Imafuku¹, A. Kawabata¹, M. Yasuda¹, T. Koide¹, H. J. Mattausch¹ (1.Hiroshima Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.G-3-2