[G-3-3] Large Scale Test Circuits for Systematic Evaluation of Variability and Noise of MOSFETs' Electrical Characteristics

Y. Kumagai¹, K. Abe¹, T. Fujisawa¹, S. Watabe¹, R. Kuroda¹, N. Miyamoto¹, T. Suwa¹, A. Teramoto¹, S. Sugawa¹, T. Ohmi¹ (1.Tohoku Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.G-3-3