[G-3-3] Large Scale Test Circuits for Systematic Evaluation of Variability and Noise of MOSFETs' Electrical Characteristics

Y. Kumagai¹、K. Abe¹、T. Fujisawa¹、S. Watabe¹、R. Kuroda¹、N. Miyamoto¹、T. Suwa¹、A. Teramoto¹、S. Sugawa¹、T. Ohmi¹ (1.Tohoku Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.G-3-3