[G-3-4] A 65nm CMOS 400ns Measurement Delay NBTI-Recovery Sensor by Minimum Assist Circuit

T. Matsumoto¹、H. Makino¹、K. Kobayashi²、H. Onodera^1,3 (1.Kyoto Univ.、2.Kyushu Inst. of Tech.、3.CREST-JST , Japan)

https://doi.org/10.7567/SSDM.2010.G-3-4