[G-3-4] A 65nm CMOS 400ns Measurement Delay NBTI-Recovery Sensor by Minimum Assist Circuit

T. Matsumoto¹, H. Makino¹, K. Kobayashi², H. Onodera^1,3 (1.Kyoto Univ., 2.Kyushu Inst. of Tech., 3.CREST-JST , Japan)

https://doi.org/10.7567/SSDM.2010.G-3-4