[P-3-24] X-Ray Radiation Effects on CMOS Image Sensor In-Pixel Devices J. Tan1, B. Buttgen1, A. J. P. Theuwissen1,2 (1.Delft Univ. of Tech. , Netherlands, 2.Harvest Imaging , Belgium) https://doi.org/10.7567/SSDM.2010.P-3-24