[P-3-24] X-Ray Radiation Effects on CMOS Image Sensor In-Pixel Devices

J. Tan¹、B. Buttgen¹、A. J. P. Theuwissen^1,2 (1.Delft Univ. of Tech. , Netherlands、2.Harvest Imaging , Belgium)

https://doi.org/10.7567/SSDM.2010.P-3-24