[AL-6-3] Characteristics of 4H-SiC p-Channel MOSFETs with Ion-Implanted Buried Channel M. Okamoto1, M. Iijima1, T. Nagano1, K. Fukuda1, H. Okumura1 (1.AIST , Japan) https://doi.org/10.7567/SSDM.2011.AL-6-3