[AL-7-5] Step-stress Reliability Studies on AlGaN/GaN HEMTs on Silicon with Buffer Thickness Dependence

A. F. Wilson¹, A. Wakejima¹, S. L. Selvaraj¹, T. Egawa¹ (1.Nagoya Inst. of Tech. , Japan)

https://doi.org/10.7567/SSDM.2011.AL-7-5