[D-1-3] An Accurate Prediction Model of Temperature Dependent Current Mismatch in All Inversion and Influence of Subthreshold Hump on Mismatch Characteristics
K. Sakakibara1, K. Arimoto1
(1.Renesas Electronics Corp. , Japan)
https://doi.org/10.7567/SSDM.2011.D-1-3
