A Consistent Modeling Framework to Explain Negative Bias Temperature Instability (NBTI) DC Stress, Recovery and AC Experiments

2011 International Conference on Solid State Devices and Materials

Sep 27, 2011 - Sep 30, 2011
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

S. Mahapatra¹, A. E. Islam², S. Deora¹, V. D. Maheta¹, M. A. Alam² (1.IIT Bombay , India, 2.Purdue Univ. , USA)