Assessment of Erase-Verify Function in NAND Arrays with Charge-Based Capacitance Measurement

L. H. Chong; Y. W. Chang; K. F. Chen; Y. J. Chen; S. H. Ku; N. K. Zous; I. J. Huang; T. T. Han; M. S. Chen; W. P. Lu; K. C. Chen; C. Y. Lu

doi:https://doi.org/10.7567/SSDM.2011.F-3-2

2011 International Conference on Solid State Devices and Materials

Sep 27, 2011 - Sep 30, 2011
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

[F-3-2] Assessment of Erase-Verify Function in NAND Arrays with Charge-Based Capacitance Measurement

L. H. Chong¹, Y. W. Chang¹, K. F. Chen¹, Y. J. Chen¹, S. H. Ku¹, N. K. Zous¹, I. J. Huang¹, T. T. Han¹, M. S. Chen¹, W. P. Lu¹, K. C. Chen¹, C. Y. Lu¹ (1.Macronix Int. Co., Ltd. , Taiwan)

https://doi.org/10.7567/SSDM.2011.F-3-2

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