Hot-Carrier Effects on High-frequency Characteristics of RF LDMOS Transistors

K. M. Chen; Z. W. Mou; H. C. Kuo; C. S. Chiu; B. Y. Chen; W. D. Liu; M. Y. Chen; Y. C. Yang; K. L. Wang; G. W. Huang

doi:https://doi.org/10.7567/SSDM.2011.P-3-7

[P-3-7] Hot-Carrier Effects on High-frequency Characteristics of RF LDMOS Transistors

K. M. Chen¹, Z. W. Mou², H. C. Kuo², C. S. Chiu¹, B. Y. Chen¹, W. D. Liu¹, M. Y. Chen³, Y. C. Yang³, K. L. Wang³, G. W. Huang^1,2 (1.National Nano Device Labs., 2.National Chiao Tung Univ., 3.United Microelectronics Corp. , Taiwan)

https://doi.org/10.7567/SSDM.2011.P-3-7

2011 International Conference on Solid State Devices and Materials

[P-3-7] Hot-Carrier Effects on High-frequency Characteristics of RF LDMOS Transistors