[P-4-4] Electrical Property of DNA FET -Charge Retention Property-

S. Takagi¹, N. Matsuo¹, K. Yamana¹, A. Heya¹, T. Takada¹, S. Yokoyama² (1.Univ. of Hyogo, 2.Hiroshima Univ. , Japan)

https://doi.org/10.7567/SSDM.2011.P-4-4