[P-4-4] Electrical Property of DNA FET -Charge Retention Property-

S. Takagi¹、N. Matsuo¹、K. Yamana¹、A. Heya¹、T. Takada¹、S. Yokoyama² (1.Univ. of Hyogo、2.Hiroshima Univ. , Japan)

https://doi.org/10.7567/SSDM.2011.P-4-4