[P-6-1] Hot Carrier Effect on RF Characteristics of High-k/Metal Gate SiGe Channel pMOSFETs

E. Y. Jeong¹, H. C. Sagong¹, D. Y. Choi¹, C. W. Sohn¹, J. S. Lee¹, C. Y. Kang², Y. H. Jeong¹ (1.POSTECH , Korea, 2.SEMATECH , USA)

https://doi.org/10.7567/SSDM.2011.P-6-1