[B-1-3] Multi-Level Cell Memory with High-Speed, Low-Voltage Writing and High Endurance Using Crystalline In-Ga-Zn Oxide Thin Film Transistor
T. Ishizu1, H. Inoue1, T. Matsuzaki1, S. Nagatsuka1, Y. Okazaki1, T. Onuki1, A. Isobe1, Y. Shionoiri1, K. Kato1, T. Okuda1, J. Koyama1, S. Yamazaki1
(1.Semiconductor Energy Laboratory Co., Ltd. , Japan)
https://doi.org/10.7567/SSDM.2012.B-1-3