[B-2-3] Single-Poly Flash Memory with Degradation-Separated Scheme

H. W. H. Ching¹、W. Robert¹、Y. Kevin¹、L. Yen Hsin¹、B. Francis¹、C. Hsin Ming¹、Y. Evans¹ (1.eMemory Tech. Inc. , Taiwan)

https://doi.org/10.7567/SSDM.2012.B-2-3