[B-2-3] Single-Poly Flash Memory with Degradation-Separated Scheme

H. W. H. Ching¹, W. Robert¹, Y. Kevin¹, L. Yen Hsin¹, B. Francis¹, C. Hsin Ming¹, Y. Evans¹ (1.eMemory Tech. Inc. , Taiwan)

https://doi.org/10.7567/SSDM.2012.B-2-3