[D-4-3] High Mobility Poly-GeSn Layer Formed by Low Temperature Solid Phase Crystallization
W. Takeuchi1, N. Taoka1, M. Kurosawa1,2, M. Fukutome1, M. Sakashita1, O. Nakatsuka1, S. Zaima1
(1.Nagoya Univ., 2.JSPS , Japan)
https://doi.org/10.7567/SSDM.2012.D-4-3