The Japan Society of Applied Physics

[E-9-3] A Novel and Direct Measurement of the Mobility on Very Small Dimension CMOS Devices with Channel Length Down to 20nm

E. R. Hsieh1, S. Chung1, C. H. Tsai2, R. M. Huang2, C. T. Tsai2, C. W. Liang2 (1.National Chiao Tung Univ., 2.UMC , Taiwan)

https://doi.org/10.7567/SSDM.2012.E-9-3