[F-3-4] Cross-correlation measurement of current noise in mesoscopic conductors using a homemade cryogenic transimpedance amplifier
M. Hashisaka1, M. Yamagishi1, K. Muraki2, T. Fujisawa1
(1.Tokyo Tech., 2.NTT Basic Research Laboratories , Japan)
https://doi.org/10.7567/SSDM.2012.F-3-4
