[F-3-4] Cross-correlation measurement of current noise in mesoscopic conductors using a homemade cryogenic transimpedance amplifier

M. Hashisaka¹、M. Yamagishi¹、K. Muraki²、T. Fujisawa¹ (1.Tokyo Tech.、2.NTT Basic Research Laboratories , Japan)

https://doi.org/10.7567/SSDM.2012.F-3-4