[G-2-6] Observation of charging and discharging effects of dopant atoms in nanoscale lateral pn junction by Kelvin probe force microscope

R. Nowak^1,2, M. Anwar¹, D. Moraru¹, T. Mizuno¹, R. Jablonski², M. Tabe¹ (1.Shizuoka Univ. , Japan, 2.Warsaw Univ. of Tech. , Pol)

https://doi.org/10.7567/SSDM.2012.G-2-6