[G-2-6] Observation of charging and discharging effects of dopant atoms in nanoscale lateral pn junction by Kelvin probe force microscope

R. Nowak^1,2、M. Anwar¹、D. Moraru¹、T. Mizuno¹、R. Jablonski²、M. Tabe¹ (1.Shizuoka Univ. , Japan、2.Warsaw Univ. of Tech. , Pol)

https://doi.org/10.7567/SSDM.2012.G-2-6