[I-3-2] Fabrication and Characterization of MFIS Capacitor Structure with Ferroelectric (Bi,Pr)(Fe,Mn)O3 Thin Films
T. Kawae1, Y. Seto1, A. Morimoto1
(1.Grad. School of Natural Sci. and Tech., Kanazawa Univ. , Japan)
https://doi.org/10.7567/SSDM.2012.I-3-2
