[J-3-2] Impact of Body-Biasing Technique on RTN-induced Delay Fluctuation

T. Matsumoto¹, K. Kobayashi^2,3, H. Onodera^1,3 (1.Kyoto Univ., 2.Kyoto Inst. Tech., 3.JST CREST , Japan)

https://doi.org/10.7567/SSDM.2012.J-3-2