[L-1-4] Effects of Trap Energy Levels on Reverse Recovery Surge of Silicon Power Diode

S. Machida¹, Y. Yamashita¹, T. Misumi², T. Sugimaya¹ (1.Toyota Central R&D Labs. Inc., 2.Toyota Motor Corp. , Japan)

https://doi.org/10.7567/SSDM.2012.L-1-4