[L-2-2] Evolution of threading edge dislocation during solution growth of SiC

S. Harada¹, Y. Yamamoto¹, K. Seki¹, A. Horio¹, T. Mitsuhashi¹, T. Ujihara¹ (1.Nagoya Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.L-2-2