[PS-14-3] Investigation of BTI degradation in LDMOS transistors

Y. Ikeda¹、H. Mori¹、T. Kato¹、T. Uemura¹、M. Yoshida¹、M. Onoda¹、H. Matsuyama¹ (1.Fujitsu Semiconductor Ltd. , Japan)

https://doi.org/10.7567/SSDM.2012.PS-14-3