[PS-14-3] Investigation of BTI degradation in LDMOS transistors

Y. Ikeda¹, H. Mori¹, T. Kato¹, T. Uemura¹, M. Yoshida¹, M. Onoda¹, H. Matsuyama¹ (1.Fujitsu Semiconductor Ltd. , Japan)

https://doi.org/10.7567/SSDM.2012.PS-14-3